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Temperature dependence of surface roughening during homoepitaxial growth on Cu(001)
Author(s) -
Cristian E. Botez,
P. F. Miceli,
Peter W. Stephens
Publication year - 2001
Publication title -
physical review. b, condensed matter
Language(s) - English
Resource type - Journals
eISSN - 1095-3795
pISSN - 0163-1829
DOI - 10.1103/physrevb.64.125427
Subject(s) - condensed matter physics , materials science , exponent , specular reflection , physics , vacancy defect , beta (programming language) , epitaxy , scattering , crystallography , optics , nanotechnology , chemistry , layer (electronics) , computer science , programming language , philosophy , linguistics

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