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Dip problem of the electron mobility on a thin helium film
Author(s) -
V. Shikin,
J. Klier,
Irena Doicescu,
A. Würl,
P. Leǐderer
Publication year - 2001
Publication title -
physical review. b, condensed matter
Language(s) - English
Resource type - Journals
eISSN - 1095-3795
pISSN - 0163-1829
DOI - 10.1103/physrevb.64.073401
Subject(s) - helium , electron , electron mobility , liquid helium , materials science , thin film , discontinuity (linguistics) , substrate (aquarium) , condensed matter physics , surface finish , atomic physics , physics , nanotechnology , optoelectronics , composite material , nuclear physics , mathematical analysis , oceanography , mathematics , geology
Electrons floating above liquid helium form an ideal two-dimensional system with an extremely high mobility. However, the mobility can change substantially when decreasing the thickness of the helium film from bulk to a thin film of a few hundred $\AA{}.$ Furthermore it is observed that for certain film thicknesses there is a pronounced dip in the mobility. We present theoretical investigations and measurements concerning this problem. Taking into account the roughness of the substrate, which supports the helium film, we find theoretically a discontinuity in the chemical potential of the electrons which results in a diplike behavior in the electron current and hence in the electron mobility. This scenario is supported by direct measurements of the electron current on substrates with different roughness and at different electron densities.

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