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Energetic, vibrational, and electronic properties of silicon using a nonorthogonal tight-binding model
Author(s) -
Noam Bernstein,
Michael J. Mehl,
D. A. Papaconstantopoulos,
N.I. Papanicolaou,
Martin Z. Bazant,
Efthimios Kaxiras
Publication year - 2000
Publication title -
physical review. b, condensed matter
Language(s) - English
Resource type - Journals
eISSN - 1095-3795
pISSN - 0163-1829
DOI - 10.1103/physrevb.62.4477
Subject(s) - tight binding , silicon , parametrization (atmospheric modeling) , ab initio , electronic structure , materials science , phonon , symmetry (geometry) , ab initio quantum chemistry methods , molecular physics , range (aeronautics) , physics , condensed matter physics , quantum mechanics , molecule , geometry , mathematics , radiative transfer , metallurgy , composite material
We present calculations of energetic, electronic, and vibrational properties of silicon using a nonorthogonal tight-binding ~TB! model derived to fit accurately first-principles calculations. Although it was fit only to a few high-symmetry bulk structures, the model can be successfully used to compute the energies and structures of a wide range of configurations. These include phonon frequencies at high-symmetry points, bulk point defects such as vacancies and interstitials, and surface reconstructions. The TB parametrization reproduces experimen- tal measurements and ab initio calculations well, indicating that it describes faithfully the underlying physics of bonding in silicon. We apply this model to the study of finite temperature vibrational properties of crystal- line silicon and the electronic structure of amorphous systems that are too large to be practically simulated with ab initio methods.

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