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Epitaxial mismatch strain inYBa2Cu3O7
Author(s) -
M. Varela,
D. Arias,
Z. Sefrioui,
C. León,
C. Ballesteros,
J. Santamarı́a
Publication year - 2000
Publication title -
physical review. b, condensed matter
Language(s) - English
Resource type - Journals
eISSN - 1095-3795
pISSN - 0163-1829
DOI - 10.1103/physrevb.62.12509
Subject(s) - epitaxy , superlattice , transmission electron microscopy , materials science , crystallography , orientation (vector space) , condensed matter physics , diffraction , physics , layer (electronics) , nanotechnology , optics , chemistry , geometry , mathematics
The effects of epitaxial strain in ultrathin YBa_(2)Cu_(3)O_(7-δ) layers have been investigated by x-ray diffraction and transmission electron microscopy. The samples used were high quality [YBa_(2)Cu_(3)O_(7-δ)(YBCO)_(N)/PrBa_(2)Cu_(3)O_(7)(PBCO)_(M)]_(1000 Å) superlattices, grown by high oxygen pressure sputtering, with N ranging between 1 and 12 unit cells and M55 unit cells. Superlattice structure is refined by fitting x-ray spectra to a structural model containing disorder related parameters. Epitaxial mismatch strain and the absence of step disorder are found for YBCO layer thickness below 4 unit cells. A surprising reorganization of interatomic distances results, which seems to correlate with the decrease in the critical temperature. For larger YBCO layer thickness, stress relaxes and step disorder builds up. Transmission electron microscopy observations show the presence of α-axis orientated microdomains, which seem to be correlated to the release of epitaxial strain, provided in plane mismatch is smaller in this orientation

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