Electronic and atomic structures of the Si-C-N thin film by x-ray-absorption spectroscopy and theoretical calculations | Zendy

Y. K. Chang | Zendy; H. H. Hsieh | Zendy; W. F. Pong | Zendy; M.-H. Tsai | Zendy; K. H. Lee | Zendy; T.-E. Dann | Zendy; F. Z. Chien | Zendy; P. K. Tseng | Zendy; K. L. Tsang | Zendy; W. K. Su | Zendy; LiChyong Chen | Zendy; ShihChun Wei | Zendy; KueiHsien Chen | Zendy; D. M. Bhusari | Zendy; Y. F. Chen | Zendy

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Electronic and atomic structures of the Si-C-N thin film by x-ray-absorption spectroscopy and theoretical calculations

Author(s) -

Y. K. Chang,

H. H. Hsieh,

W. F. Pong,

M.-H. Tsai,

K. H. Lee,

T.-E. Dann,

F. Z. Chien,

P. K. Tseng,

K. L. Tsang,

W. K. Su,

LiChyong Chen,

ShihChun Wei,

KueiHsien Chen,

D. M. Bhusari,

Y. F. Chen

Publication year - 1998

Publication title -

physical review. b, condensed matter

Language(s) - English

Resource type - Journals

eISSN - 1095-3795

pISSN - 0163-1829

DOI - 10.1103/physrevb.58.9018

Subject(s) - exciton , spectral line , atomic physics , antibonding molecular orbital , materials science , k edge , absorption edge , absorption spectroscopy , absorption (acoustics) , resonance (particle physics) , spectroscopy , crystallography , physics , electron , chemistry , condensed matter physics , optics , band gap , quantum mechanics , composite material , optoelectronics , astronomy , atomic orbital

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