Raman scattering from vibrational modes inSi 46 clathrates
Author(s) -
Shaoli Fang,
L. Grigorian,
P. C. Eklund,
G. Dresselhaus,
M. S. Dresselhaus,
Hitoshi Kawaji,
S. Yamanaka
Publication year - 1998
Publication title -
physical review. b, condensed matter
Language(s) - English
Resource type - Journals
eISSN - 1095-3795
pISSN - 0163-1829
DOI - 10.1103/physrevb.57.7686
Subject(s) - raman spectroscopy , physics , raman scattering , phonon , spectral line , charge (physics) , order (exchange) , crystallography , metal , atomic physics , materials science , condensed matter physics , chemistry , quantum mechanics , finance , economics , metallurgy
Room-temperature Raman-scattering spectra are reported for the type-II superconductors M xBaySi46 ~M 5Na,K! that were recently shown to exhibit Tc’s ;3.5 K. These spectra are compared to those of Na 8Si46 and K7Si46 clathrates that exhibit normal metallic behavior down to 2 K. In the Si 46 system, fifteen of the eighteen Si related first-order Raman frequencies predicted by group theory have been detected, and the frequencies are found to be sensitive to the particular dopants. The Raman linewidths observed for the M xBaySi46 system are comparable to those observed for Na 8Si46 and K7Si46. The data, taken collectively, suggest that the line broadening in the metallic Si clathrates is due to important contributions from both the electron-phonon interaction as well as from a random filling of the Si cages and charge-transfer disorder. @S0163-1829 ~98!01810-4#
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