X-ray reflectivity study of the surface of liquid gallium | Zendy

Erina Kawamoto | Zendy; S. Lee | Zendy; P. S. Pershan | Zendy; Moshe Deutsch | Zendy; Nissan Maskil | Zendy; B. M. Ocko | Zendy

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X-ray reflectivity study of the surface of liquid gallium

Author(s) -

Erina Kawamoto,

S. Lee,

P. S. Pershan,

Moshe Deutsch,

Nissan Maskil,

B. M. Ocko

Publication year - 1993

Publication title -

physical review. b, condensed matter

Language(s) - English

Resource type - Journals

eISSN - 1095-3795

pISSN - 0163-1829

DOI - 10.1103/physrevb.47.6847

Subject(s) - x ray reflectivity , gallium , reflectivity , optics , surface (topology) , physics , materials science , x ray , condensed matter physics , atomic physics , geometry , mathematics , metallurgy

X-ray reflectivity from the surface of liquid gallium was measured under ultrahigh vacuum conditions using a novel technique for curved surfaces. The small deviations between the measured and theoretical Fresnel reflectivity for an ideally sharp flat interface for wave-vector transfer [approx lt]0.5 A[sup [minus]1] imply an interfacial width for the electron density profile of [approx lt]1.3[plus minus]0.2 A. This is consistent with a model of atomic close packing which lacks structure along the surface normal at length scales [gt]10 A.

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