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Experiments on intrinsic and thermally induced chaos in an rf-driven Josephson junction
Author(s) -
A. Davidson,
B. Dueholm,
M. R. Beasley
Publication year - 1986
Publication title -
physical review. b, condensed matter
Language(s) - English
Resource type - Journals
eISSN - 1095-3795
pISSN - 0163-1829
DOI - 10.1103/physrevb.33.5127
Subject(s) - josephson effect , noise (video) , physics , chaotic , microwave , chaos (operating system) , condensed matter physics , thermal , thermal fluctuations , statistical physics , superconductivity , quantum mechanics , computer science , thermodynamics , computer security , artificial intelligence , image (mathematics)
We report detailed measurements of low-frequency noise due to microwaves applied to a real Josephson tunnel junction. An intrinsically chaotic region is apparently identified, but the effects of thermal noise are shown to be significant. In particular we show experimental data that we interpret as evidence for thermally activated hopping and thermally affected chaos. The data are only in qualitative accord with recent ideas regarding the effect of thermal noise on intermittent chaos.

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