Ring charging of a single silicon dangling bond imaged by noncontact atomic force microscopy | Zendy

Natalia Turek | Zendy; S. Godey | Zendy; D. Deresmes | Zendy; Thierry Mélin | Zendy

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Ring charging of a single silicon dangling bond imaged by noncontact atomic force microscopy

Author(s) -

Natalia Turek,

S. Godey,

D. Deresmes,

Thierry Mélin

Publication year - 2020

Publication title -

physical review. b./physical review. b

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.78

H-Index - 465

eISSN - 2469-9969

pISSN - 2469-9950

DOI - 10.1103/physrevb.102.235433

Subject(s) - kelvin probe force microscope , dangling bond , substrate (aquarium) , radius , silicon , microscopy , materials science , non contact atomic force microscopy , atomic force microscopy , electrostatic force microscope , conductive atomic force microscopy , photoconductive atomic force microscopy , spectroscopy , ring (chemistry) , atomic physics , molecular physics , condensed matter physics , physics , optoelectronics , optics , chemistry , nanotechnology , scanning capacitance microscopy , scanning confocal electron microscopy , oceanography , computer security , organic chemistry , quantum mechanics , geology , computer science

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