Epsilon-Near-Zero Substrate Engineering for Ultrathin-Film Perfect Absorbers
Author(s) -
Jura Rensberg,
You Zhou,
Steffen Richter,
Chenghao Wan,
Shuyan Zhang,
Philipp Schöppe,
Rüdiger SchmidtGrund,
Shriram Ramanathan,
Federico Capasso,
Mikhail A. Kats,
Carsten Ronning
Publication year - 2017
Publication title -
physical review applied
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.883
H-Index - 75
eISSN - 2331-7043
pISSN - 2331-7019
DOI - 10.1103/physrevapplied.8.014009
Subject(s) - substrate (aquarium) , materials science , wavelength , plasmon , optoelectronics , optics , zero (linguistics) , reflection (computer programming) , near infrared spectroscopy , physics , computer science , linguistics , oceanography , philosophy , programming language , geology
Coatings much thinner than the wavelength of incident light not only suppress reflection from the substrate, but also can absorb almost all of the light, if the optical properties of film and substrate are perfectly matched. This research offers a general strategy to find all suitable film-substrate combinations, and demonstrates that low-loss, epsilon-near-zero substrates like (Al,Zn)O are a promising platform for wavelength-tunable ultrathin-film perfect absorbers, which could serve as alternatives to plasmonic metasurfaces in the near infrared, for example.
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