Open AccessPhotoinduced Atomic Force Spectroscopy and Imaging of Two-Dimensional Materials
Author(s) -
T. U. Tumkur,
M.A. Hurier,
M.D. Pichois,
M. Vomir,
Bertrand Donnio,
JeanLouis Gallani,
M. V. Rastei
Publication year - 2019
Publication title -
physical review applied
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.883
H-Index - 75
eISSN - 2331-7043
pISSN - 2331-7019
DOI - 10.1103/physrevapplied.11.044066
Subject(s) - spectroscopy , materials science , atomic force microscopy , kelvin probe force microscope , absorption (acoustics) , microscopy , force spectroscopy , imaging spectroscopy , optics , optoelectronics , nanotechnology , physics , quantum mechanics , composite material
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