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Branching ratios of x-ray photons from dielectronic recombination processes in H-like titanium ions
Author(s) -
Brian E. O’Rourke,
F. J. Currell,
H. Kuramoto,
S. Ohtani,
Hirofumi Watanabe,
Y. M. Li,
Takehiko Tawara,
XiaoMin Tong
Publication year - 2008
Publication title -
physical review a
Language(s) - English
Resource type - Journals
eISSN - 1094-1622
pISSN - 1050-2947
DOI - 10.1103/physreva.77.062709
Subject(s) - excited state , physics , atomic physics , ion , electron beam ion trap , electron , autoionization , branching fraction , population , electron capture , ground state , photon , recombination , branching (polymer chemistry) , electron shell , photoionization , ionization , nuclear physics , cathode ray , chemistry , biochemistry , quantum mechanics , gene , demography , organic chemistry , sociology
In dielectronic recombination of hydrogenlike ions an intermediate doubly excited heliumlike ion is formed. Since the K shell is empty, both excited electrons can decay sequentially to the ground state. In this paper we analyze the x-ray radiation emitted from doubly and singly excited heliumlike titanium ions produced inside the Tokyo electron beam ion trap. Theoretical population densities of the singly excited states after the first transition and the transition probabilities of these states into the ground state were also calculated. This allowed theoretical branching ratios to be determined for each manifold. These branching ratios are compared to the experimentally obtained x-ray distribution by fitting across the relevant peak using a convolution of the theoretically obtained resonance strengths and energies. By taking into account 2E1 transitions which are not observed in the experiment, the measured and calculated ratios agree well. This method provides a valuable insight into the transition dynamics of excited highly charged ions

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