Correlating Yeast Cell Stress Physiology to Changes in the Cell Surface Morphology: Atomic Force Microscopic Studies
Author(s) -
Elisabetta Canetta,
Graeme M. Walker,
Ashok K. Adya
Publication year - 2006
Publication title -
the scientific world journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.453
H-Index - 93
eISSN - 2356-6140
pISSN - 1537-744X
DOI - 10.1100/tsw.2006.166
Subject(s) - atomic force microscopy , yeast , schizosaccharomyces pombe , cell , saccharomyces cerevisiae , cell physiology , biophysics , morphology (biology) , schizosaccharomyces , substrate (aquarium) , eukaryotic cell , nanotechnology , adhesion , cell adhesion , microbiology and biotechnology , chemistry , biology , materials science , biochemistry , ecology , genetics , organic chemistry
Atomic Force Microscopy (AFM) has emerged as a powerful biophysical tool in biotechnology and medicine to investigate the morphological, physical, and mechanical properties of yeasts and other biological systems. However, properties such as, yeasts' response to environmental stresses, metabolic activities of pathogenic yeasts, cell-cell/cell-substrate adhesion, and cell-flocculation have rarely been investigated so far by using biophysical tools. Our recent results obtained by AFM on one strain each of Saccharomyces cerevisiae and Schizosaccharomyces pombe show a clear correlation between the physiology of environmentally stressed yeasts and the changes in their surface morphology. The future directions of the AFM related techniques in relation to yeasts are also discussed.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom