Refractive index sensing with Fano resonances in silicon oligomers | Zendy

Katie E. Chong | Zendy; Henry W. Orton | Zendy; Isabelle Staude | Zendy; Manuel Decker | Zendy; Andrey E. Miroshnichenko | Zendy; Igal Brener | Zendy; Yuri S. Kivshar | Zendy; Dragomir N. Neshev | Zendy

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Refractive index sensing with Fano resonances in silicon oligomers

Author(s) -

Katie E. Chong,

Henry W. Orton,

Isabelle Staude,

Manuel Decker,

Andrey E. Miroshnichenko,

Igal Brener,

Yuri S. Kivshar,

Dragomir N. Neshev

Publication year - 2017

Publication title -

philosophical transactions of the royal society a mathematical physical and engineering sciences

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.074

H-Index - 169

eISSN - 1471-2962

pISSN - 1364-503X

DOI - 10.1098/rsta.2016.0070

Subject(s) - fano resonance , refractive index , figure of merit , nanophotonics , silicon , fano plane , materials science , interference (communication) , optics , absorption (acoustics) , optoelectronics , plasmon , physics , telecommunications , computer science , mathematics , channel (broadcasting) , pure mathematics

We demonstrate experimentally refractive index sensing with localized Fano resonances in silicon oligomers, consisting of six disks surrounding a central one of slightly different diameter. Owing to the low absorption and narrow Fano-resonant spectral features appearing as a result of the interference of the modes of the outer and the central disks, we demonstrate refractive index sensitivity of more than 150 nm RIU -1 with a figure of merit of 3.8.This article is part of the themed issue 'New horizons for nanophotonics'.

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