Open AccessNew possibilities with aberration-corrected electron microscopy
Author(s) -
D. J. H. Cockayne,
Angus I. Kirkland,
Peter D. Nellist,
Andrew Bleloch
Publication year - 2009
Publication title -
philosophical transactions of the royal society a mathematical physical and engineering sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.074
H-Index - 169
eISSN - 1471-2962
pISSN - 1364-503X
DOI - 10.1098/rsta.2009.0135
Subject(s) - electron microscope , microscopy , materials science , nanotechnology , optics , physics
Unlike light microscopy, where resolution is diffraction Thursday, August 6, 2009 at 5:26 pmlimited, the achievable resolution of electron microscopes is limited by lens aberrations so severe that the practical resolution is orders of magnitude worse than the diffraction limit. About 10 years ago,
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