Non-topographic current contrast in scanning field emission microscopy | Zendy

Gabriele Bertolini | Zendy; O. Gürlü | Zendy; Robin Pröbsting | Zendy; D. Westholm | Zendy; Jiapeng Wei | Zendy; U. Ramsperger | Zendy; D.A. Zanin | Zendy; H. Cabrera | Zendy; D. Pescia | Zendy; J. P. Xanthakis | Zendy; M. Schnedler | Zendy; Rafal E. DuninBorkowski | Zendy

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Non-topographic current contrast in scanning field emission microscopy

Author(s) -

Gabriele Bertolini,

O. Gürlü,

Robin Pröbsting,

D. Westholm,

Jiapeng Wei,

U. Ramsperger,

D.A. Zanin,

H. Cabrera,

D. Pescia,

J. P. Xanthakis,

M. Schnedler,

Rafal E. DuninBorkowski

Publication year - 2021

Publication title -

royal society open science

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.84

H-Index - 51

ISSN - 2054-5703

DOI - 10.1098/rsos.210511

Subject(s) - field electron emission , quantum tunnelling , monatomic ion , field (mathematics) , optics , current (fluid) , contrast (vision) , materials science , scanning tunneling microscope , microscopy , physics , electron , optoelectronics , nanotechnology , mathematics , quantum mechanics , pure mathematics , thermodynamics

In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin et al. 2016 Proc. R. Soc. A 472 , 20160475. ( doi:10.1098/rspa.2016.0475 )), the field-emitted current was found to change by approximately 1% at a monatomic surface step (approx. 200 pm thick). Here we prepare surface domains of adjacent different materials that, in some instances, have a topographic contrast smaller than 15 pm. Nevertheless, we observe a contrast in the field-emitted current as high as 10%. This non-topographic collector material dependence is a yet unexplored degree of freedom calling for a new understanding of the quantum mechanical tunnelling barrier at the source site that takes into account the properties of the material at the collector site.

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