Negative-tone molecular glass photoresist for high-resolution electron beam lithography
Author(s) -
Yafei Wang,
Long Chen,
YU Jia-Ting,
Xudong Guo,
Shuangqing Wang,
Guoqiang Yang
Publication year - 2021
Publication title -
royal society open science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.84
H-Index - 51
ISSN - 2054-5703
DOI - 10.1098/rsos.202132
Subject(s) - photoresist , electron beam lithography , materials science , resist , lithography , x ray lithography , tone (literature) , cathode ray , optoelectronics , optics , next generation lithography , thermal stability , photolithography , electron , nanotechnology , chemistry , physics , art , literature , organic chemistry , layer (electronics) , quantum mechanics
A low molecular weight organic compound containing bis-phenol A backbone (BPA-6OH) is reported as a negative-tone photoresist. This material has a high glass transition temperature and excellent thermal stability. A good contrast, well-resolved line pattern around 73.4 nm and sensitivity of 52 µC cm −2 can be received for negative-tone molecular glass photoresist upon exposure in electron beam lithography system. It indicates that the negative-tone molecular glass photoresist is one of the promising candidates for use in electron beam lithography.
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