Open AccessPM-22 Surveillance study on the SI-traceable nanometrology by transmission electron microscopy (TEM) and trial fabrication of reference materials for TEM
Author(s) -
Keita Kobayashi
Publication year - 2019
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dfz089
Subject(s) - nanometrology , transmission electron microscopy , materials science , fabrication , nanotechnology , atomic force microscopy , medicine , alternative medicine , pathology
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