Open AccessSS2-2 Frontiers of AFM imaging method –high-resolution AFM in liquids and subsurface imaging–
Author(s) -
Hirofumi Yamada,
Kei Kobayashi
Publication year - 2019
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dfz067
Subject(s) - atomic force microscopy , materials science , nanotechnology , superresolution , high resolution , computer science , remote sensing , geology , image (mathematics) , computer vision
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