KA-2 Structural Analysis Based on Measurements of Slight Cation Displacements from High Resolution STEM Images
Author(s) -
Shunsuke Kobayashi
Publication year - 2019
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dfz044
Subject(s) - high resolution , resolution (logic) , geology , materials science , chemistry , remote sensing , computer science , artificial intelligence
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