Open Access3aA_MI-7Atomic Resolution Imaging and Analysis of 2D-materials at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun
Author(s) -
Hiroki Hashiguchi,
Ryusuke Sagawa,
Eiji Okunishi,
Noriaki Endo,
Yukihito Kondo
Publication year - 2018
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dfy081
Subject(s) - field emission gun , acceleration voltage , resolution (logic) , microscope , materials science , optics , acceleration , field electron emission , physics , scanning electron microscope , nuclear physics , computer science , classical mechanics , artificial intelligence , cathode ray , electron
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