Open Access2aB_SS2-1Scanning precession electron diffraction used to determine precipitate microstructure and its evolution during aging in Al-Mg-Si(-Cu) alloys
Author(s) -
Jonas K. Sunde,
Elisabeth Thronsen,
Calin D. Marioara,
Antonius T. J. van Helvoort,
Kenji Matsuda,
Randi Holmestad
Publication year - 2018
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dfy058
Subject(s) - microstructure , materials science , electron diffraction , electron , precession , crystallography , diffraction , condensed matter physics , metallurgy , chemistry , physics , optics , nuclear physics
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