Open Access2aA_SS1-3Three-dimensional study of EuBa2Cu3Oy coated conductors using focused ion beam-scanning electron microscopy
Author(s) -
Daisaku Yokoe,
Ryuji Yoshida,
Takeharu Kato,
A. Ibi,
Tsukasa Hirayama,
Teruo Izumi
Publication year - 2018
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dfy054
Subject(s) - materials science , scanning electron microscope , focused ion beam , electrical conductor , electron microscope , microscopy , ion beam , ion , electron beam induced deposition , nanotechnology , optics , beam (structure) , composite material , chemistry , scanning transmission electron microscopy , physics , organic chemistry
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