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This publication is a systematic investigation of the effect the improvement of dark-reference images has on the resulting bright-field images. For this, data were acquired with three different charge-coupled device cameras attached to two different transmission electron microscopes. Multi-frame acquisitions and methods to correct x-ray noise are introduced and quantified as options to improve the dark-reference images. Furthermore, the influence of x-ray noise on transmission electron microscopy measurements is discussed and observations on its composition are shared.

Noise reduction in CCD measurements by improving the quality of dark-reference images