Noise reduction in CCD measurements by improving the quality of dark-reference images | Zendy

Tobias Heil | Zendy; G.J. Tatlock | Zendy

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Noise reduction in CCD measurements by improving the quality of dark-reference images

Author(s) -

Tobias Heil,

G.J. Tatlock

Publication year - 2018

Publication title -

microscopy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.545

H-Index - 52

eISSN - 2050-5701

pISSN - 2050-5698

DOI - 10.1093/jmicro/dfy006

Subject(s) - noise (video) , dark field microscopy , charge coupled device , dark frame subtraction , optics , noise reduction , transmission (telecommunications) , image noise , physics , computer science , materials science , microscopy , artificial intelligence , image processing , image (mathematics) , median filter , telecommunications

This publication is a systematic investigation of the effect the improvement of dark-reference images has on the resulting bright-field images. For this, data were acquired with three different charge-coupled device cameras attached to two different transmission electron microscopes. Multi-frame acquisitions and methods to correct x-ray noise are introduced and quantified as options to improve the dark-reference images. Furthermore, the influence of x-ray noise on transmission electron microscopy measurements is discussed and observations on its composition are shared.

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