Automated data collection in single particle electron microscopy | Zendy

Yong Zi Tan | Zendy; Anchi Cheng | Zendy; Clinton S. Potter | Zendy; Bridget Carragher | Zendy

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Automated data collection in single particle electron microscopy

Author(s) -

Yong Zi Tan,

Anchi Cheng,

Clinton S. Potter,

Bridget Carragher

Publication year - 2015

Publication title -

microscopy

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 0.545

H-Index - 52

eISSN - 2050-5701

pISSN - 2050-5698

DOI - 10.1093/jmicro/dfv369

Subject(s) - automation , data collection , workflow , software , computer science , particle (ecology) , electron microscope , engineering , database , physics , optics , operating system , mechanical engineering , geology , statistics , oceanography , mathematics

Automated data collection is an integral part of modern workflows in single particle electron microscopy (EM) research. This review surveys the software packages available for automated single particle EM data collection. The degree of automation at each stage of data collection is evaluated, and the capabilities of the software packages are described. Finally, future trends in automation are discussed.

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