Dispersion relations for coupled surface plasmon-polariton modes excited in multilayer structures
Author(s) -
Hikaru Saito,
Kyoko Namura,
Motofumi Suzuki,
Hiroki Kurata
Publication year - 2013
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dft047
Subject(s) - dispersion relation , excited state , surface plasmon polariton , polariton , excitation , materials science , dispersion (optics) , surface plasmon , plasmon , electron energy loss spectroscopy , electron , atomic physics , molecular physics , coupling (piping) , electron excitation , optics , physics , optoelectronics , nanotechnology , transmission electron microscopy , quantum mechanics , metallurgy
The coupled surface plasmon-polariton (SPP) modes excited in an Al/SiO2/Al multilayer structure were analyzed using angle-resolved electron energy-loss spectroscopy (AREELS) with a relativistic electron probe. The dispersion relations for the coupled SPP modes were then directly observed and compared with predicted relations obtained via calculations. Good agreement was noted between the experimental and calculated results. In the multilayer structures, the dispersion relation for the coupled SPP modes was found to be sensitive to the thickness of each film, which could be interpreted qualitatively by the electron energy-loss probability calculated for thin aluminum (Al) films and narrow Al gaps using Kröger's formula. It was demonstrated that significant differences in the excitation probability for SPPs could be observed depending on the coupling modes.
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