Small-angle electron scattering of magnetic fine structures
Author(s) -
Yoshihiko Togawa
Publication year - 2013
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dft007
Subject(s) - reciprocal lattice , magnet , condensed matter physics , magnetic structure , lorentz transformation , scattering , electron , magnetic moment , physics , magnetic field , deflection angle , lattice (music) , small angle scattering , magnetic lens , materials science , diffraction , optics , magnetization , classical mechanics , quantum mechanics , acoustics
Magnetic structures in magnetic artificial lattices and chiral magnetic orders in chiral magnets have been quantitatively analyzed in the reciprocal space by means of small-angle electron scattering (SAES) method. Lorentz deflection due to magnetic moments and Bragg diffraction due to periodicity are simultaneously recorded at an angle of the order of or less than 1 × 10(-6) rad, using a camera length of more than 100 m. The present SAES method, together with TEM real-space imaging methods such as in-situ Lorentz microscopy, is very powerful in analyzing magnetic fine structures in magnetic materials. Indeed, the existence of both a chiral helimagnetic structure and a chiral magnetic soliton lattice in a chiral magnet CrNb3S6 has been successfully verified for the first time using the present complementary methods.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom