Development of an environmental high-voltage electron microscope for reaction science
Author(s) -
Nobuo Tanaka,
Jiro Usukura,
Michiko Kusunoki,
Yahachi Saito,
Katuhiro Sasaki,
Takayoshi Tanji,
Shunsuke Muto,
Shigeo Arai
Publication year - 2013
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dfs095
Subject(s) - transmission electron microscopy , electron microscope , electron tomography , energy filtered transmission electron microscopy , scanning transmission electron microscopy , environmental scanning electron microscope , materials science , nanotechnology , electron , nanomaterials , conventional transmission electron microscope , acceleration voltage , scanning electron microscope , high resolution transmission electron microscopy , resolution (logic) , electron beam induced deposition , energy dispersive x ray spectroscopy , nanometre , optics , physics , cathode ray , computer science , quantum mechanics , artificial intelligence
Environmental transmission electron microscopy and ultra-high resolution electron microscopic observation using aberration correctors have recently emerged as topics of great interest. The former method is an extension of the so-called in situ electron microscopy that has been performed since the 1970s. Current research in this area has been focusing on dynamic observation with atomic resolution under gaseous atmospheres and in liquids. Since 2007, Nagoya University has been developing a new 1-MV high voltage (scanning) transmission electron microscope that can be used to observe nanomaterials under conditions that include the presence of gases, liquids and illuminating lights, and it can be also used to perform mechanical operations to nanometre-sized areas as well as electron tomography and elemental analysis by electron energy loss spectroscopy. The new instrument has been used to image and analyse various types of samples including biological ones.
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