New views of materials through aberration-corrected scanning transmission electron microscopy | Zendy

Stephen J. Pennycook | Zendy; M. Varela | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

New views of materials through aberration-corrected scanning transmission electron microscopy

Author(s) -

Stephen J. Pennycook,

M. Varela

Publication year - 2011

Publication title -

microscopy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.545

H-Index - 52

eISSN - 2050-5701

pISSN - 2050-5698

DOI - 10.1093/jmicro/dfr030

Subject(s) - scanning transmission electron microscopy , optics , electron , electron energy loss spectroscopy , resolution (logic) , energy filtered transmission electron microscopy , high resolution transmission electron microscopy , materials science , electron tomography , spectroscopy , transmission (telecommunications) , transmission electron microscopy , physics , nanotechnology , computer science , telecommunications , artificial intelligence , quantum mechanics

The successful correction of third-order and, more recently, fifth-order aberrations has enormously enhanced the capabilities of the scanning transmission electron microscope (STEM), by not only achieving record resolution, but also allowing near 100% efficiency for electron energy loss spectroscopy, and higher currents for two-dimensional spectrum imaging. These advances have meant that the intrinsic advantages of the STEM, incoherent imaging and simultaneous collection of multiple complementary images can now give new insights into many areas of materials physics. Here, we review a number of examples, mostly from the field of complex oxides, and look towards new directions for the future.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research