Coherent electron interference from amorphous TEM specimens | Zendy

Rodney Herring | Zendy; Koh Saitoh | Zendy; Nobuo Tanaka | Zendy; Takayoshi Tanji | Zendy

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Coherent electron interference from amorphous TEM specimens

Author(s) -

Rodney Herring,

Koh Saitoh,

Nobuo Tanaka,

Takayoshi Tanji

Publication year - 2010

Publication title -

journal of electron microscopy

Language(s) - English

Resource type - Journals

eISSN - 1477-9986

pISSN - 0022-0744

DOI - 10.1093/jmicro/dfq024

Subject(s) - optics , electron diffraction , interference (communication) , interferometry , materials science , diffraction , transmission electron microscopy , wavefront , interference microscopy , amorphous solid , coherence (philosophical gambling strategy) , electron microscope , electron , scattering , resolution (logic) , physics , chemistry , crystallography , channel (broadcasting) , electrical engineering , quantum mechanics , artificial intelligence , computer science , engineering

For the first time, the electron intensity on the diffraction plane from amorphous transmission electron microscope (TEM) specimens has been found to have sufficient coherence to produce fringes in interferograms that were created using a wavefront splitting method of diffracted beam interferometry. The fringes were found to exist from low to high electron-scattering angles. Their spatial frequency depended on the angular overlap of the interfering beams, which was controlled by an electron biprism. From these interferograms, phase information of amorphous materials, which is information now lacking and required for determining their atomic structures, was obtained. An immediate application of this interference is a new method to determine the spatial resolution of the TEM that occurs at the shear angle for fringe disappearance.

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