Phase plates in the transmission electron microscope: operating principles and applications | Zendy

Marek Malac | Zendy; Simon Hettler | Zendy; Misa Hayashida | Zendy; Emi Kano | Zendy; R.F. Egerton | Zendy; Marco Beleggia | Zendy

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Phase plates in the transmission electron microscope: operating principles and applications

Author(s) -

Marek Malac,

Simon Hettler,

Misa Hayashida,

Emi Kano,

R.F. Egerton,

Marco Beleggia

Publication year - 2020

Publication title -

microscopy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.545

H-Index - 52

eISSN - 2050-5701

pISSN - 2050-5698

DOI - 10.1093/jmicro/dfaa070

Subject(s) - phase (matter) , scanning transmission electron microscopy , microscope , optics , electron , transmission electron microscopy , electron tomography , transmission (telecommunications) , focus (optics) , materials science , electron microscope , physics , computer science , telecommunications , nuclear physics , quantum mechanics

In this paper, we review the current state of phase plate imaging in a transmission electron microscope. We focus especially on the hole-free phase plate design, also referred to as the Volta phase plate. We discuss the implementation, operating principles and applications of phase plate imaging. We provide an imaging theory that accounts for inelastic scattering in both the sample and in the hole-free phase plate.

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