z-logo
open-access-imgOpen Access
Phase detection limits in off-axis electron holography from pixelated detectors: gain variations, geometric distortion and failure of reference-hologram correction
Author(s) -
Martin Hÿtch,
Christophe Gatel
Publication year - 2020
Publication title -
microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.545
H-Index - 52
eISSN - 2050-5701
pISSN - 2050-5698
DOI - 10.1093/jmicro/dfaa044
Subject(s) - holography , optics , detector , distortion (music) , phase (matter) , physics , noise (video) , amplitude , interference (communication) , pixel , computer science , optoelectronics , image (mathematics) , artificial intelligence , telecommunications , amplifier , channel (broadcasting) , cmos , quantum mechanics
We investigate the effect that recording off-axis electron holograms on pixelated detectors, such as charge-coupled devices (CCD) and direct-detection devices (DDD), can have on measured amplitudes and phases. Theory will be developed for the case of perfectly uniform interference fringes illuminating an imperfect detector with gain variations and pixel displacements. We will show that both these types of defect produce a systematic noise in the phase images that depends on the position of the holographic fringes with respect to the detector. Subtracting a reference hologram from the object hologram will therefore not remove the phase noise if the initial phases of the two holograms do not coincide exactly. Another finding is that pi-shifted holograms are much less affected by gain variations but show no improvement concerning geometric distortions. The resulting phase errors will be estimated and simulations presented that confirm the theoretical developments.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom