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Cytological changes in chlorhexidine-resistant isolates of Pseudomonas stutzeri
Author(s) -
Unchalee Tattawasart,
A.C. Hann,
JeanYves Maillard,
J. R. Furr,
A.D. Russell
Publication year - 2000
Publication title -
journal of antimicrobial chemotherapy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.124
H-Index - 194
eISSN - 1460-2091
pISSN - 0305-7453
DOI - 10.1093/jac/45.2.145
Subject(s) - pseudomonas stutzeri , bacterial outer membrane , lysis , chlorhexidine , transmission electron microscopy , microbiology and biotechnology , ultrastructure , chemistry , bacteria , membrane , electron microscope , cytoplasm , pseudomonas aeruginosa , scanning electron microscope , cell membrane , biophysics , biology , materials science , biochemistry , medicine , botany , nanotechnology , genetics , physics , dentistry , escherichia coli , optics , composite material , gene
Transmission electron microscopy (TEM), scanning electron microscopy (SEM) and energy-dispersive analysis of X-ray (EDAX) have been used to examine chlorhexidine diacetate (CHA)-sensitive and -resistant isolates of Pseudomonas stutzeri and to determine the effects of CHA on the cells. Significant differences were observed in the structure, size and elemental composition of CHA-sensitive and -resistant cells. Treatment with CHA produced considerably greater changes in CHA-sensitive cells, with widespread peeling of the outer membrane, a substantial loss of cytoplasmic electron-dense material and extensive lysis. Cells from the resistant isolates showed no blebbing of the outer membrane and no structural damage. X-ray mapping confirmed the difference in CHA uptake between CHA-sensitive and CHA-resistant cells. It is proposed that changes in the outer membrane form a major mechanism of resistance to CHA in P. stutzeri.

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