Reliability equivalence factors for a series-parallel system of components with exponentiated Weibull lifetimes
Author(s) -
Safar M. Alghamdi,
David F. Percy
Publication year - 2015
Publication title -
ima journal of management mathematics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.484
H-Index - 34
eISSN - 1471-6798
pISSN - 1471-678X
DOI - 10.1093/imaman/dpv001
Subject(s) - weibull distribution , equivalence (formal languages) , reliability (semiconductor) , reliability engineering , imperfect , computer science , mathematics , statistics , discrete mathematics , physics , engineering , thermodynamics , power (physics) , linguistics , philosophy
We study reliability equivalence factors of a system of independent and identical components with exponentiated Weibull lifetimes. The system has $n$ subsystems connected in parallel and subsystem $i$ has $m_{i}$ components connected in series, $i=1,\ldots,n$. We consider improving the reliability of the system by (a) a reduction method and (b) several duplication methods: (i) hot duplication; (ii...
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