PolishEM: image enhancement in FIB–SEM | Zendy

JoséJesús Fernández | Zendy; Teobaldo E. Torres | Zendy; Eva Martin-Solana | Zendy; Gerardo F. Goya | Zendy; María Rosario FernándezFernández | Zendy

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PolishEM: image enhancement in FIB–SEM

Author(s) -

JoséJesús Fernández,

Teobaldo E. Torres,

Eva Martin-Solana,

Gerardo F. Goya,

María Rosario FernándezFernández

Publication year - 2020

Publication title -

bioinformatics

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 3.599

H-Index - 390

eISSN - 1367-4811

pISSN - 1367-4803

DOI - 10.1093/bioinformatics/btaa218

Subject(s) - image (mathematics) , image enhancement , computer science , scanning electron microscope , materials science , computer vision , artificial intelligence , composite material

We have developed a software tool to improve the image quality in focused ion beam-scanning electron microscopy (FIB-SEM) stacks: PolishEM. Based on a Gaussian blur model, it automatically estimates and compensates for the blur affecting each individual image. It also includes correction for artifacts commonly arising in FIB-SEM (e.g. curtaining). PolishEM has been optimized for an efficient processing of huge FIB-SEM stacks on standard computers.

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