Introgression of a 4D chromosomal fragment into durum wheat confers aluminium tolerance
Author(s) -
Chang Dong Han,
Peter R. Ryan,
Zehong Yan,
Emmanuel Delhaize
Publication year - 2014
Publication title -
annals of botany
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.567
H-Index - 176
eISSN - 1095-8290
pISSN - 0305-7364
DOI - 10.1093/aob/mcu070
Subject(s) - biology , introgression , genetics , botany , gene
Aluminium (Al(3+)) inhibits root growth of sensitive plant species and is a key factor that limits durum wheat (Triticum turgidum) production on acid soils. The aim of this study was to enhance the Al(3+) tolerance of an elite durum cultivar by introgression of a chromosomal fragment from hexaploid wheat (Triticum aestivum) that possesses an Al(3+) tolerance gene.
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