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Achieving High Reliability in Histology
Author(s) -
Yael Heher,
Yigu Chen,
Sergey Pyatibrat,
Edward Yoon,
Jeffrey D. Goldsmith,
Kenneth Sands
Publication year - 2016
Publication title -
american journal of clinical pathology
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.859
H-Index - 128
eISSN - 1943-7722
pISSN - 0002-9173
DOI - 10.1093/ajcp/aqw148
Subject(s) - histology , reliability (semiconductor) , medicine , pathology , physics , power (physics) , quantum mechanics
Despite sweeping medical advances in other fields, histology processes have by and large remained constant over the past 175 years. Patient label identification errors are a known liability in the laboratory and can be devastating, resulting in incorrect diagnoses and inappropriate treatment. The objective of this study was to identify vulnerable steps in the histology workflow and reduce the frequency of labeling errors (LEs).

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