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Towards in-situ quality control of conductive printable electronics: a review of possible pathways
Author(s) -
Mariia Zhuldybina,
X. Ropagnol,
F. Blanchard
Publication year - 2021
Publication title -
flexible and printed electronics
Language(s) - English
Resource type - Journals
ISSN - 2058-8585
DOI - 10.1088/2058-8585/ac442d
Subject(s) - electronics , quality (philosophy) , nanotechnology , automotive industry , atomic force microscopy , manufacturing engineering , printed electronics , aerospace , engineering , electrical engineering , materials science , physics , aerospace engineering , quantum mechanics
Over the past decade, printed electronics (PE) has shown great potential for a wide range of industries, from consumer goods, electronics, aerospace, automotive, pharmaceutical, biomedical, to textiles and fashion. The rapid development of printing technology has been strongly driven by the growth of the PE market and its many applications. Here, we review the latest trends in PE production quality control, focusing on emerging technologies such as terahertz spectroscopy, which may play a key role in the development of smart manufacturing of PE devices in the near future. We also provide a comparison with conventional quality control technologies or off-line measurements, such as four-point probe measurements, atomic force microscopy, optical microscopy, etc.

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