
Statistical characteristics of fluctuation of heights, surface roughness and fractal properties of Cu thin films
Author(s) -
M Khaneghie,
Akbar Zendehnam,
Maryam Mirzaei
Publication year - 2007
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/61/1/107
Subject(s) - fractal , surface roughness , surface finish , materials science , thin film , surface (topology) , fractal dimension , statistical physics , condensed matter physics , composite material , mathematics , geometry , nanotechnology , physics , mathematical analysis