Open AccessSpecialized probes with nanowhisker structures for scanning probe microscopy
Author(s) -
M. V. Zhukov,
I. V. Kukhtevich,
V. V. Levichev,
I. S. Mukhin,
A. O. Golubok
Publication year - 2014
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/541/1/012042
Subject(s) - nanotechnology , materials science , nanostructure , scanning probe microscopy , cantilever , scanning ion conductance microscopy , scanning electron microscope , amorphous solid , lithography , microscopy , nanoparticle , kelvin probe force microscope , amorphous carbon , scanning capacitance microscopy , atomic force microscopy , analytical chemistry (journal) , optoelectronics , scanning confocal electron microscopy , optics , crystallography , chemistry , composite material , physics , chromatography