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Hot-carrier induced photon-emission in silicon metal-oxide-semiconductor field-effect-transistor
Author(s) -
Kun Xu,
G.P. Li
Publication year - 2014
Publication title -
journal of physics. conference series
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/488/13/132036
Subject(s) - materials science , optoelectronics , silicon , field effect transistor , semiconductor , metal , oxide , transistor , photon , optics , electrical engineering , physics , metallurgy , engineering , voltage

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