Open AccessA built-in self-test module for 16-bit parallel photon counting circuit using 180 nm CMOS process
Author(s) -
Suhaila Isaak,
H.C. Yeo,
C.K. Chang,
Y. Yusuf
Publication year - 2022
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/2312/1/012039
Subject(s) - accumulator (cryptography) , built in self test , field programmable gate array , computer hardware , cmos , computer science , photon counting , verilog , sensitivity (control systems) , electronic circuit , chip , electronic engineering , embedded system , engineering , detector , electrical engineering , algorithm