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Structure of an incommensurate 90° Si grain boundary resolved with the help of a Cs-corrector for illumination
Author(s) -
Jean-Luc Rouvière,
Frédéric Lançon,
K. Rousseau,
Damien Caliste,
PierreHenri Jouneau,
Frank Fournel
Publication year - 2010
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/209/1/012041
Subject(s) - transmission electron microscopy , perpendicular , wafer , grain boundary , crystallography , optics , materials science , condensed matter physics , geometry , physics , chemistry , microstructure , nanotechnology , mathematics

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