Open AccessDepth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution
Author(s) -
Kenta Amemiya,
Jun Miyawaki,
Hitoshi Abe,
Erika O. Sako,
Masako Sakamaki
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/190/1/012108
Subject(s) - x ray absorption fine structure , materials science , profiling (computer programming) , resolution (logic) , nuclear magnetic resonance , physics , spectroscopy , quantum mechanics , artificial intelligence , computer science , operating system