Open AccessNumerical characterization of local electrical breakdown in sub-micrometer metallized film capacitors
Author(s) -
Wei Jiang,
Ya Zhang,
Annemie Bogaerts
Publication year - 2014
Publication title -
new journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.584
H-Index - 190
ISSN - 1367-2630
DOI - 10.1088/1367-2630/16/11/113036
Subject(s) - electric field , electron , physics , capacitor , atomic physics , ion , field electron emission , glow discharge , voltage , secondary emission , breakdown voltage , range (aeronautics) , plasma , materials science , quantum mechanics , composite material