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Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection
Author(s) -
Eline Janssens,
Jan De Beenhouwer,
Mattias van Dael,
Thomas De Schryver,
Luc Van Hoorebeke,
Pieter Verboven,
Bart Nicolaı̈,
Jan Sijbers
Publication year - 2017
Publication title -
measurement science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.48
H-Index - 136
eISSN - 1361-6501
pISSN - 0957-0233
DOI - 10.1088/1361-6501/aa9de3
Subject(s) - hilbert transform , computer science , throughput , artificial neural network , pixel , detector , artificial intelligence , computer vision , object (grammar) , algorithm , telecommunications , filter (signal processing) , wireless
X-ray imaging is an important tool for quality control since it allows to inspect the interior of products in a non-destructive way. Conventional x-ray imaging, however, is slow and expensive. Inline x-ray inspection, on the other hand, can pave the way towards fast and individual quality control, provided that a sufficiently high throughput can be achieved at a minimal cost. To meet these criteria, an inline inspection acquisition geometry is proposed where the object moves and rotates on a conveyor belt while it passes a fixed source and detector. Moreover, for this acquisition geometry, a new neural-network-based reconstruction algorithm is introduced: the neural network Hilbert transform based filtered backprojection. The proposed algorithm is evaluated both on simulated and real inline x-ray data and has shown to generate high quality reconstructions of 400 × 400 reconstruction pixels within 200 ms, thereby meeting the high throughput criteria.

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