Risk of Cervical Intraepithelial Neoplasia Grade 2 or 3 after Loop Electrosurgical Excision Procedure Associated with Human Papillomavirus Type 16 Variants
Author(s) -
Long Fu Xi,
Nancy B. Kiviat,
Cosette M. Wheeler,
Aimée R. Kreimer,
Jesse Ho,
Laura A. Koutsky
Publication year - 2007
Publication title -
the journal of infectious diseases
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.69
H-Index - 252
eISSN - 1537-6613
pISSN - 0022-1899
DOI - 10.1086/513441
Subject(s) - cervical intraepithelial neoplasia , squamous intraepithelial lesion , medicine , human papillomavirus , loop electrosurgical excision procedure , confidence interval , colposcopy , relative risk , electrosurgery , intraepithelial neoplasia , gynecology , papillomaviridae , koilocyte , lesion , cervical cancer , pathology , surgery , cancer , prostate
Identification of factors associated with risk of relapse after treatment for high-grade cervical intraepithelial neoplasia (CIN) has important clinical implications. Study subjects were women participating in the Atypical Squamous Cells of Undetermined Significance and Low-Grade Squamous Intraepithelial Lesion Triage Study who were treated for CIN3 by loop electrosurgical excision procedure (LEEP) and who had a baseline infection with human papillomavirus type 16 (HPV16). These women were followed every 6 months for 2 years. Post-LEEP CIN2-3 was found in 20 (10.0%) of the 201 women. An adjusted relative risk of 3.1 (95% confidence interval, 1.1-8.9) was associated with HPV16 non-European, compared with European, variants, a finding that is consistent with the variant-related risk of prevalent/incident high-grade CIN.
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