X‐Ray Spectral Variability in the Initial Rise of XTE J1550−564 | Zendy

Y. X. Wu | Zendy; C.Z. Liu | Zendy; T. P. Li | Zendy

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X‐Ray Spectral Variability in the Initial Rise of XTE J1550−564

Author(s) -

Y. X. Wu,

C.Z. Liu,

T. P. Li

Publication year - 2007

Publication title -

the astrophysical journal

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 2.376

H-Index - 489

eISSN - 1538-4357

pISSN - 0004-637X

DOI - 10.1086/513304

Subject(s) - physics , astrophysics , millisecond , x ray , shot (pellet) , bin , astronomy , optics , materials science , algorithm , computer science , metallurgy

X-ray variability of the microquasar XTE J1550-564 is studied with timedomain techniques for the data from the RXTE/PCA observation in September 8,1998. The 2--60 keV averaged shot is obtained from superposing shots with onemillisecond time bin through aligning their peaks. The spectral behavior duringthe averaged shot exhibits prominent differences from that observed in Cyg X-1.The hardness ratio of (13--60 keV)/(2--13 keV) or (16--60 keV)/(13--16 keV)during a shot is lower or higher than that of steady emission respectively. Thecorrelation coefficient between intensity and hardness ratio of (13--60keV)/(2--13 keV) or (16--60 keV)/(13--16 keV) is negative or positiverespectively. These results may indicate that physical processes in the lowstate of XTE J1550-564 are different from those in Cyg X-1.Comment: 20 pages, 9 figures, To appear in ApJ May 200

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