Open AccessScanning Transmission Electron Microscopy at High Resolution
Author(s) -
J.S. Wall,
John P. Langmore,
M. Isaacson,
A. V. Crewe
Publication year - 1974
Publication title -
proceedings of the national academy of sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.011
H-Index - 771
eISSN - 1091-6490
pISSN - 0027-8424
DOI - 10.1073/pnas.71.1.1
Subject(s) - dark field microscopy , scanning transmission electron microscopy , resolution (logic) , brightness , conventional transmission electron microscope , transmission electron microscopy , scanning confocal electron microscopy , materials science , uranium , optics , high resolution transmission electron microscopy , electron microscope , scanning electron microscope , field electron emission , microscope , micrograph , electron , crystallite , low voltage electron microscope , energy filtered transmission electron microscopy , microscopy , physics , nuclear physics , artificial intelligence , computer science , metallurgy
We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 A is found in dark field images of micro-crystallites of uranium and thorium compounds. Furthermore, adequate contrast is available to observe single atoms as light as silver.
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