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Combinatorial approach for ferroelectric material libraries prepared by liquid source misted chemical deposition method
Author(s) -
Ki Woong Kim,
Min Ku Jeon,
Kwang Seok Oh,
Tai Suk Kim,
Yun Seok Kim,
Seong Ihl Woo
Publication year - 2007
Publication title -
proceedings of the national academy of sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.011
H-Index - 771
eISSN - 1091-6490
pISSN - 0027-8424
DOI - 10.1073/pnas.0610146104
Subject(s) - ferroelectricity , materials science , homogeneous , thin film , deposition (geology) , piezoelectricity , analytical chemistry (journal) , chemical composition , combinatorial synthesis , nanotechnology , chemistry , optoelectronics , chromatography , combinatorial chemistry , mathematics , composite material , organic chemistry , sediment , dielectric , combinatorics , biology , paleontology
Combinatorial approach for discovering novel functional materials in the huge diversity of chemical composition and processing conditions has become more important for breakthrough in thin film electronic and energy-conversion devices. The efficiency of combinatorial method depends on the preparation of a reliable high-density composition thin-film library. The physico-chemical properties of each sample on the library should be similar to those of the corresponding samples prepared by one-by-one conventional methods. We successfully developed the combinatorial liquid source misted chemical deposition (LSMCD) method and demonstrated its validity in screening the chemical composition of Bi3.75 Lax Ce0.25-x Ti3 O12 (BLCT) for high remanent polarization (P r ). LSMCD is a cheap promising combinatorial screening tool. It can control the composition up to ppm level and produce homogeneous multicomponent library. LSMCD method allows us to prepare BLCT thin-film library at the variation of 0.4 mol% of La. Maximum 2P r is 35 μC/cm−2 atx = 0.21. The intensity of (117) XRD peak is quantitatively related to 2P r . Newly developed scanning piezoelectric deformation measurement for nano-sized samples using scanning probe microscope (SPM) is also found out to be reliable for determining the relative ranking ofP r value rapidly.

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